| 000 | 01077cam a22003014a 4500 | ||
|---|---|---|---|
| 005 | 20250914124600.0 | ||
| 008 | 021001s2001 gw a b 001 0 eng | ||
| 020 |
_a3540678417 (alk. paper) _cRM357.10 |
||
| 039 | 9 |
_a201910310846 _bhayat _c201210040925 _dyah _c200302101224 _dhayat _c200302041609 _dfarid _y10-01-2002 _zsanusi |
|
| 090 | _aTA417.23.F848 3 | ||
| 090 |
_aTA417.23 _b.F848 |
||
| 100 | 1 | _aFultz, Brent. | |
| 245 | 1 | 0 |
_aTransmission electron microscopy and diffractometry of materials / _cBrent Fultz, James Howe. |
| 260 |
_aBerlin : _bSpringer, _c2001. |
||
| 300 |
_axix, 748 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 |
_aMaterials _xMicroscopy. |
|
| 650 | 0 | _aTransmission electron microscopy. | |
| 650 | 0 | _aX-ray diffractometer. | |
| 700 | 1 | _aHowe, James M. | |
| 907 |
_a.b13109649 _b2021-05-28 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kTA417.23.F848 3 |
||
| 914 | _avtls000323816 | ||
| 990 | _afa | ||
| 991 | _aPascasiswazah-KEJ-P | ||
| 998 |
_al _b2002-01-10 _cm _da _feng _ggw _y0 _z.b13109649 |
||
| 999 |
_c310635 _d310635 |
||