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_aIEEE transactions on reliability / _cProfessional Technical Group on Reability |
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_aNew York, N.Y. : _bInstitute of Electrical and Electronics Engineers, _c1963 - |
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| 500 | _aUKM: v.39-41 (1990-1992). | ||
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_aElectronics _vPeriodicals |
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_aElectronics industries _xQuality control _vPeriodicals |
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_a.b13030802 _b2021-11-18 _c2019-11-12 |
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_c7 _n0 _kSiri TK7800.I4 1990 |
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| 991 | _aFakulti Kejuruteraan | ||
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