| 000 | 01182nam a2200301 a 4500 | ||
|---|---|---|---|
| 005 | 20250914122628.0 | ||
| 007 | hd ufu baaa | ||
| 008 | 020413s1999 my a am 00 eng | ||
| 039 | 9 |
_a200804202204 _bnordin _y04-13-2002 _ztrainer |
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| 040 | _aUKM | ||
| 090 | _amikrofilem tesis TK7874.75.A47 1999 | ||
| 090 |
_amikrofilem tesis TK7874.75 _b.A47 1999 |
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| 100 | 1 | _aAltaf-ul-Amin, Md. | |
| 245 | 1 | 3 |
_aAn approach to current sensor and test processor design for simultaneous logic and IDDQ testing of CMOS integrated circuits _h[microform] / _cMd. Altaf-ul-Amin |
| 260 |
_aBangi : _bPerpustakaan Tun Seri Lanang, _c1999 |
||
| 300 |
_a1 microfilm reel ; _c35 mm. |
||
| 502 | _aThesis (M.Sc.) - Universiti Kebangsaan Malaysia, 1999 | ||
| 650 | 0 |
_aIntegrated circuits _xVery large scale integration _xTesting |
|
| 650 | 0 | _aIddq testing | |
| 650 | 0 |
_aMetal oxide semiconductors, Complementary _xTesting |
|
| 907 |
_a.b13010980 _b2022-05-23 _c2019-11-12 |
||
| 942 |
_c3 _n0 _kmikrofilem tesis TK7874.75.A47 1999 |
||
| 914 | _avtls000313260 | ||
| 990 | _aani | ||
| 991 | _aFakulti Kejuruteraan | ||
| 998 |
_at _b2002-01-04 _cm _dy _feng _gmy _y0 _z.b13010980 |
||
| 999 |
_c301397 _d301397 |
||