000 01238nam a2200337 a 4500
005 20250914102007.0
008 010801s1998 xxua bi 001 0 eng
020 _a0824790391 (alk. paper)
_cRM944.70
039 9 _a201104281603
_bariff
_c200108071219
_dhamudah
_c200108011049
_dhamzah
_y08-01-2001
_zhamzah
040 _aUKM
090 _aQD506.E44 1998
090 _aQD506
_b.E44 1998
245 0 0 _aElectrical phenomena at interfaces :
_bfundamentals, measurements, and applications
250 _a2nd ed., rev. and expanded /
_bedited by Hiroyuki Ohshima, Kunio Furusawa
260 _aNew York :
_bM. Dekker,
_c1998
300 _axiii, 628 p. :
_bill. ;
_c26 cm.
440 0 _aSurfactant science series ;
_vv. 76
500 _aSurfactant science series ;
_vv. 76
504 _aIncludes bibliographical references and index
650 0 _aSurface chemistry
650 0 _aElectric double layer
700 1 _aOhshima, Hiroyuki,
_d1944-
700 1 _aFurusawa, Kunio,
_d1937-
907 _a.b12883682
_b2021-05-28
_c2019-11-12
942 _c01
_n0
_kQD506.E44 1998
914 _avtls000299735
990 _aam
991 _aPusat Pengajian Fizik Gunaan
998 _at
_b2001-01-08
_cm
_da
_feng
_gxxu
_y0
_z.b12883682
999 _c288891
_d288891