| 000 | 01012nam a2200313 a 4500 | ||
|---|---|---|---|
| 005 | 20250914094854.0 | ||
| 008 | 010126s1998 xxua b 001 0 eng | ||
| 010 | _a97-052094 | ||
| 020 |
_a0471241393 _cRM420.25 |
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| 039 | 9 |
_y01-26-2001 _zbedah |
|
| 090 | _aQC611.S373 1998 | ||
| 090 | _aQC611 | ||
| 100 | 1 | _aSchroder, Dieter K. | |
| 245 | 0 | 0 |
_aSemiconductor material and device characterization / _cDieter K. Schroder. |
| 250 | _a2nd ed. | ||
| 260 |
_aNew York : _bJohn Wiley & Sons, _c1998. |
||
| 300 |
_axxiv, 760 p. : _bill. ; _c25 cm. |
||
| 500 | _a'A Wiley-Interscience publication.' | ||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 | _aSemiconductors. | |
| 650 | 0 |
_aSemiconductors _xTesting. |
|
| 907 |
_a.b12795768 _b2021-05-28 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kQC611.S373 1998 |
||
| 914 | _avtls000289407 | ||
| 990 | _aza | ||
| 991 | _aJabatan Kejuruteraan Elektrik dan Elektronik | ||
| 998 |
_at _b2001-01-01 _cm _da _feng _gxxu _y0 _z.b12795768 |
||
| 999 |
_c280225 _d280225 |
||