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| 005 | 20250914091012.0 | ||
| 008 | 991112s1998 xxua 000 0 eng | ||
| 020 |
_a0471974013 _cRM273.16 |
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| 090 | _aTK7871.852.B4313 | ||
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| 100 | 1 | 0 | _aBeck, Friedrich. |
| 245 | 1 | 0 |
_aIntegrated circuit failure analysis : _ba guide to preparation techniques / _cFriedrich Beck ; translated by Stephen S. Wilson. |
| 246 | _aA guide to preparation techniques. | ||
| 260 |
_aChichester : _bJohn Wiley & Sons, _c1998. |
||
| 300 |
_a173 p. : _bill. ; _c25 cm. |
||
| 440 | _aWiley series in quality and reliability engineering. | ||
| 650 | 0 |
_aSemiconductors _xFailures. |
|
| 650 | 0 |
_aSemiconductors _xTesting. |
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| 907 |
_a.b12555393 _b2021-05-28 _c2019-11-12 |
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_c01 _n0 _kTK7871.852.B4313 |
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| 990 | _asbs | ||
| 991 | _aFakulti Kejuruteraan | ||
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_al _at _b1999-12-11 _cm _da _feng _gxxu _y0 _z.b12555393 |
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_c256673 _d256673 |
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