000 01013nam a2200289 a 4500
005 20250914090808.0
008 990903s1998 xxua b 001 0 eng
010 _a98-004505
020 _a0137863101
_cRM361.80
039 9 _a199909301203
_bstaff
_c199909301139
_dstaff
_y09-03-1999
_zVLOAD
090 _aTK7874.A524
090 _aTK7874
245 0 0 _aAnalog and mixed-signal test /
_ceditor, Bapiraju Vinnakota.
260 _aUpper Saddle River, N.J :
_bPrentice Hall PTR,
_c1998.
300 _axix, 261 p. :
_bill. ;
_c24 cm.
504 _aIncludes bibliographical references and index.
650 0 _aLinear integrated circuits
_xTesting.
650 0 _aMixed signal circuits
_xTesting.
700 1 _aVinnakota, Bapiraju.
907 _a.b12523963
_b2021-05-28
_c2019-11-12
942 _c01
_n0
_kTK7874.A524
914 _avtls000260161
990 _amanmon
991 _aJabatan Kejuruteraan Elektrik, Elektronik dan Sistem.
998 _at
_b1999-03-09
_cm
_da
_feng
_gxxu
_y0
_z.b12523963
999 _c253618
_d253618