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| 008 | 981208s1995 my 00 eng | ||
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| 090 | _aTK7874.75.A45 1995 3tesis | ||
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| 100 | 1 | _aAhmed, Iftekhar | |
| 245 | 1 | 0 |
_aVLSI circuit testing using probabilistic approach _cIftekhar Ahmed |
| 260 |
_aBangi _bUniversiti Kebangsaan Malaysia _c1995 |
||
| 300 | _a182 p. : ill. ; 30 cm. | ||
| 502 | _aThesis (Doctor of Philosophy) - Universiti Kebangsaan Malaysia, 1995 | ||
| 650 | 0 |
_aIntegrated circuits _xLarge scale integration |
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_a.b12452385 _b2025-07-18 _c2019-11-12 |
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| 991 | _aFakulti Kejuruteraan | ||
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_al _b1999-05-08 _cm _dx _feng _gmy _y0 _z.b12452385 |
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