| 000 | 01093nam a2200349 a 4500 | ||
|---|---|---|---|
| 005 | 20250930110509.0 | ||
| 008 | 981208s1988 xxu 00 eng | ||
| 010 | _a88-61362 | ||
| 020 | _a081868786X | ||
| 035 | _a528349 | ||
| 039 | 9 |
_y08-18-1999 _zload |
|
| 090 | _aTK7874.T8857 | ||
| 090 | _aTK7874 | ||
| 245 | 1 | 0 |
_aTutorial, test generation for VLSI chips _cedited by Vishwani D. Agrawal and Sharad C. Seth |
| 260 |
_aWashington, D.C. _bIEEE computer Society _c1988 |
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| 300 | _ax, 401 p. : ill. ; 29 cm. | ||
| 504 | _aBibliography : p. 333-394 | ||
| 590 | _a1 | ||
| 650 |
_aIntegrated circuits _xVery large scale integration _xTesting |
||
| 650 | _aAutomatic checkout equipment | ||
| 700 | 1 |
_aAgrawal, Vishwani D., _d1943- _933937 |
|
| 700 | 1 | _aSeth, Sharad C. | |
| 711 | 2 | _aIEEE Computer Society | |
| 907 |
_a.b12396217 _b2021-05-28 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kTK7874.T8857 |
||
| 914 | _avtls000247097 | ||
| 990 | _agabai | ||
| 991 | _aFakulti Kejuruteraan | ||
| 998 |
_al _b1999-05-08 _cm _da _feng _gxxu _y0 _z.b12396217 |
||
| 999 |
_c240901 _d240901 |
||