| 000 | 00755nam a2200241 a 4500 | ||
|---|---|---|---|
| 005 | 20250914082401.0 | ||
| 008 | 981208s1991 xxk 00 eng | ||
| 020 | _a0471925861 | ||
| 039 | 9 |
_y08-18-1999 _zload |
|
| 090 |
_aTK7895 _b.M4G155 |
||
| 100 | 1 | _aGoor, A. J. van de | |
| 245 | 1 | 0 |
_aTesting semiconductor memories _btheory and practice _cA. J. van de Goor |
| 260 |
_aChichester _bJohn Wiley & Sons _c1991 |
||
| 300 |
_a512 p. : _bill. ; _c23 cm. |
||
| 650 | 0 |
_aSemiconductor storage devices _xTesting |
|
| 907 |
_a.b12320407 _b2024-02-16 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kTK7895 .M4G155 |
||
| 914 | _avtls000239362 | ||
| 990 | _amur | ||
| 991 | _aFakulti Ekonomi | ||
| 998 |
_al _b1999-05-08 _cm _da _feng _gxxk _y0 _z.b12320407 |
||
| 999 |
_c233370 _d233370 |
||