| 000 | 00745nam a2200241 a 4500 | ||
|---|---|---|---|
| 005 | 20250930110137.0 | ||
| 008 | 981208s1976 enk 00 eng d | ||
| 020 | _a0333184009 | ||
| 039 | 9 |
_y08-18-1999 _zload |
|
| 090 |
_aTK7815 _b.S52 3 |
||
| 100 | 1 | _aSimpson, A. (Arnold) | |
| 245 | 1 | 0 |
_aTesting methods and reliability _belectronics _cA. Simpson |
| 260 |
_aLondon _bMacMillan _c1976 |
||
| 300 |
_a172p : _bill ; _c24cm |
||
| 650 | 0 |
_aElectronics _959628 |
|
| 907 |
_a.b12320304 _b2024-02-16 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kTK7815 .S52 3 |
||
| 914 | _avtls000239352 | ||
| 991 | _aFakulti Sains Fizik dan Gunaan | ||
| 991 | _aFakulti Sains dan Sumber Alam | ||
| 998 |
_al _b1999-05-08 _cm _da _feng _genk _y0 _z.b12320304 |
||
| 999 |
_c233360 _d233360 |
||