| 000 | 00865nam a2200265 a 4500 | ||
|---|---|---|---|
| 008 | 981208s19781978nyu 00 eng d | ||
| 010 | _a78-206 | ||
| 020 | _a0122413601 | ||
| 035 | _a39749 | ||
| 040 | _aUKM | ||
| 090 |
_aTA418.7 _b.S67 3 [00006001315] |
||
| 090 | _aTA418.7 | ||
| 245 | 0 | 0 |
_aSpeckle metrology _cedited by Robert K. Erf. |
| 260 |
_aNew York _bAcademic Press _c1978. |
||
| 300 |
_axiv, 331 p. _b:ill. _c;24 cm. |
||
| 440 | 0 | _aQuantum electronics--principles and applications. | |
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | _aSpeckle metrology. | ||
| 700 | 1 | _aErf, Robert K. | |
| 907 |
_a.b12184767 _b2023-04-03 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kTA418.7 .S67 3 [00006001315] |
||
| 914 | _avtls000225517 | ||
| 991 | _aFakulti Sains Fizik dan Gunaan | ||
| 998 |
_al _b1999-05-08 _cm _da _feng _g _y0 _z.b12184767 |
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| 999 |
_c219916 _d219916 |
||