000 00877nam a2200265 a 4500
008 981208s19761975ja a 00 eng d
020 _a0070542732
040 _aUKM
090 _aQC611.24
_b.R86
100 1 _aRunyan, W. R. (Walter R.)
245 1 0 _aSemiconductor measurements and instrumentation /
_cby W.R. Runyan.
260 _aTokyo:
_bMcGraw-Hill,
_c1976.
300 _avii,280p:
_bill;
_c26 cm.
440 _aTexas instruments electronics series.
500 _aPublished in the United States: 1975.
500 _aInternational student edition.
504 _aIndex.
650 0 _aSemiconductors.
907 _a.b12092940
_b2022-10-31
_c2019-11-12
942 _c01
_n0
_kQC611.24 .R86
914 _avtls000216159
991 _aFakulti Sains Fizik dan Gunaan
991 _aFakulti Kejuruteraan
998 _at
_b1999-05-08
_cm
_da
_feng
_gja
_y0
_z.b12092940
999 _c210793
_d210793