| 000 | 01022nam a2200229 a 4500 | ||
|---|---|---|---|
| 008 | 981208s1988 xxu 00 eng | ||
| 020 | _a0471918326 | ||
| 040 | _aUKM | ||
| 090 |
_aQD96.S43 _bI58 1987 |
||
| 111 | 2 |
_aInternational Conference on Secondary Ion Mass Spectrometry _n(6th : _d1987 : _cVersailles, France) |
|
| 245 | 1 | 0 |
_aSecondary ion mass spectometry : _bSIMS VI : _bproceedings of the sixth international conference on secondary ion mass spectrometry (SMIS VI) : _bpalais des congres, Versailles, Paris, France September 13-18th, 1987 / _ceditors A. Benninghoven ... (et al.). |
| 260 |
_aChichester : _bJohn Wiley & Sons _c1988 |
||
| 300 |
_a1078 p. : _bill. ; _c24 cm. |
||
| 650 | 0 |
_aSecondary ion mass spectrometry _vCongresses. |
|
| 711 | 1 | _aBenningheven, A. | |
| 907 |
_a.b12074883 _b2022-05-25 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kQD96.S43 I58 1987 |
||
| 914 | _avtls000214318 | ||
| 990 | _amur | ||
| 991 | _aFakulti Sains Fizik dan Gunaan | ||
| 998 |
_at _b1999-05-08 _cm _da _feng _gxxu _y0 _z.b12074883 |
||
| 999 |
_c208995 _d208995 |
||