000 00791nam a2200205 a 4500
008 981208s1983 xxu 00 eng b
040 _aUKM
090 _aW3.SC425N 1983 9
245 1 0 _aScanning electron microscopy
_b1983, an international journal of scanning electron microscopy, related techniques, and applications
260 _aInc., AMF O'Hare (Chicago) Ill.
_bScanning Electron Microscopy
_c1983
300 _a4 parts : ill. ; 29 cm.
650 _aMicroscopy, Electron, Scanning
_xPeriodicals
711 2 _aScanning Electron Microscopy, Inc.
907 _a.b12059420
_b2022-09-12
_c2019-11-12
942 _c01
_n0
_kW3.SC425N 1983 9
914 _avtls000212754
990 _aECH
991 _aFakulti Perubatan
998 _ad
_b1999-05-08
_cm
_da
_feng
_gxxu
_y0
_z.b12059420
999 _c207452
_d207452