000 00884nam a2200253 a 4500
005 20250914072714.0
007 he amu baau
008 981208s1993 xxu bm 00 eng
090 _amikrofis tesis TD245.S5L43 1993
090 _amikrofis tesis TD245.S5
_bL43 1993
100 0 _aLee, Kyungho
_eauthor
245 1 4 _aThe reliability of ultrathin silicon dioxide
_h[microform] /
_cKyungho Lee
260 _aAnn Arbor, Mich. :
_bUniversity Microfilms International,
_c1993
300 _a2 microfiches ;
_c11 x 15 cm.
502 _aThesis (Ph.D.) - University of Minnesota, 1993
650 0 _aSilica
907 _a.b11989518
_b2022-04-04
_c2019-11-12
942 _c3
_n0
_kmikrofis tesis TD245.S5L43 1993
914 _avtls000205625
990 _ano
991 _aFakulti Sains Fizik dan Gunaan
998 _at
_b1999-05-08
_cm
_da
_feng
_gxxu
_y0
_z.b11989518
999 _c200488
_d200488