| 000 | 00798nam a2200229 a 4500 | ||
|---|---|---|---|
| 008 | 981208s1981 uk 00 eng d | ||
| 020 | _a0471280283 | ||
| 040 | _aUKM | ||
| 090 |
_aTK7871.85 _b.R44 |
||
| 245 | 1 | 0 |
_aReliability and degradation _bsemiconductor devices and circuits/ _cedited by M.J.Howes, D.V.Morgan. |
| 260 |
_aChichester: _bJohn Wiley & Sons, _c1981. |
||
| 300 |
_a444p.; _c23 cm. |
||
| 440 | _aThe Wiley series in solid state devices and circuits. | ||
| 650 | 0 |
_aSemiconductors _xReliability. |
|
| 700 | 1 | _aHowes, M.J. | |
| 700 | 1 | _aMorgan, D.V. | |
| 907 |
_a.b11989154 _b2022-03-30 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kTK7871.85 .R44 |
||
| 914 | _avtls000205587 | ||
| 991 | _aFakulti Sains Fizik dan Gunaan | ||
| 998 |
_al _at _b1999-05-08 _cm _da _feng _gau _y0 _z.b11989154 |
||
| 999 |
_c200452 _d200452 |
||