000			01678nam a2200409 a 4500
005			20250914072450.0
008			981208s1977 us 00 eng d
010			_a76-40363
020			_a0824765419
035			_a30903
039		9	_y08-18-1999 _zload
090			_aTK7870.S945 1974
090			_aTK7870
110	2		_aSymposium on Rational Fault Analysis (1974 : Texas)
245	1	0	_aRational fault analysis _bproceedings of the Symposium on Rational Fault Analysis held at Texas Tech University August 19-20, 1974 _cedited by Richard Sacks, Stanley R. Liberty
260			_aNew York _bM. Dekker _c1977
300			_aix, 241 p ill 24 cm
440			_aElectrical engineering and electronics _v1
500			_aCo-sponsored by the Office of Naval Research and the Army Research Office
500			_aProceedings of the Symposium on Rational Fault Analysis held at Texas Tech University August 19-20, 1974
504			_aIncludes bibliographies and index
590			_a1
650			_aElectronic apparatus and appliances _xTesting _xCongresses
650			_aElectronic apparatus and appliances _xReliability _xCongresses
650			_aAutomatic checkout equipment _xCongresses
710	1		_aSaeks, Richard
710	1		_aLiberty, Stanley R, b.1942
710	2		_aSymposium on Rational Fault Analysis (1974 : Texas Tech University, Lubbock, Texas)
710	1		_aUnited States. Army Research Office
907			_a.b11959411 _b2020-10-15 _c2019-11-12
942			_c01 _n0 _kTK7870.S945 1974
914			_avtls000202528
991			_aFakulti Kejuruteraan
998			_at _b1999-05-08 _cm _da _feng _g _y0 _z.b11959411
999			_c197493 _d197493