000 01185nam a2200337 a 4500
005 20250914065936.0
008 981208s1975 xxu 00 eng b
020 _a0306308207
039 9 _a199910271900
_bsanusi
_y08-18-1999
_zload
040 _aUKM
090 _aQH212.S3
_b.P895 1975 9
245 1 0 _aPractical scanning electron microscopy :
_belectron and ion microprobe analysis /
_cedited by Joseph I. Goldstein and Harvey Yakowitz forward by T.E. Everhart.
260 _aNew York :
_bPlenum Press,
_c1975.
300 _a582 pages :
_billustration ;
_c24 cm.
504 _aIncludes bibliographical references and index
590 _a1
590 _a1
650 _aScanning electron microscopes
650 0 _aMicroprobe analysis
650 0 _aElectron probe microanalysis
650 0 _aMicroscopy, Electron, Scanning
700 1 _aYakowitz, Harvey
700 1 _aGoldstein, Joseph I.
907 _a.b11838139
_b2021-06-24
_c2019-11-12
942 _c01
_n0
_kQH212.S3 .P895 1975 9
914 _avtls000190158
991 _aFakulti Sains Hayat
991 _aFakulti Perubatan
998 _ad
_at
_b1999-05-08
_cm
_da
_feng
_gxxu
_y0
_z.b11838139
999 _c185409
_d185409