| 000 | 00850nam a2200253 a 4500 | ||
|---|---|---|---|
| 005 | 20250914065018.0 | ||
| 008 | 981208s1969 xxu 00 eng | ||
| 039 | 9 |
_y08-18-1999 _zload |
|
| 040 | _aUKM | ||
| 090 |
_aQC176 _b.E2 1976 |
||
| 111 | 2 | _aEastern Analytical Symposium (1967 : New York). | |
| 245 | 1 | 0 |
_aPhysical measurement and analysis of thin films/ _cedited by E. M. Murt and W. G. Guldner. |
| 260 |
_aNew York: _bPlenum Press, _c1969. |
||
| 300 |
_axi, 194 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographies. | ||
| 650 | 0 | _aThin films. | |
| 711 | 1 | _aMurt, E. M. | |
| 711 | 1 | _aGuldner, W. G. | |
| 907 |
_a.b11772827 _b2021-02-10 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kQC176 .E2 1976 |
||
| 914 | _avtls000183489 | ||
| 991 | _aFakulti Sains Fizik dan Gunaan | ||
| 998 |
_at _b1999-05-08 _cm _da _feng _gxxu _y0 _z.b11772827 |
||
| 999 |
_c178897 _d178897 |
||