| 000 | 01242nam a2200301 a 4500 | ||
|---|---|---|---|
| 008 | 981208s1975 xxua 00 eng | ||
| 020 | _a0471790206 | ||
| 040 | _aUKM | ||
| 090 |
_aQH212 _b.E4S53 |
||
| 245 | 0 | 0 |
_aPhysical aspects of electron microscopy and microbeam analysis / _cedited by Benjamin M. Siegel, and Donald R. Beaman. |
| 260 |
_aNew York : _bWiley, _c1975 |
||
| 300 |
_axiii, 474 pages. : _billustrations. ; _c26 cm. |
||
| 500 | _aExpanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973. | ||
| 500 | _a'A Wiley biomedical-health publication.' | ||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 | _aElectron microscopes. | |
| 650 | 0 | _aMicroprobe analysis. | |
| 650 | 0 | _aMicrochemistry. | |
| 700 | 1 | _aSiegel, Benjamin M. | |
| 700 | 1 | _aBeaman, Donald Robert. | |
| 711 | 2 | _aElectron Microscopy Society of America. | |
| 711 | 2 | _aMicrobeam Analysis Society. | |
| 907 |
_a.b11770594 _b2021-03-05 _c2019-11-12 |
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| 942 |
_c01 _n0 _kQH212 .E4S53 |
||
| 914 | _avtls000183262 | ||
| 991 | _aFakulti Sains Hayat | ||
| 998 |
_at _b1999-05-08 _cm _da _feng _gxxu _y0 _z.b11770594 |
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| 999 |
_c178674 _d178674 |
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