000 01170nam a2200325 a 4500
005 20250914013439.0
008 981208s1975 xxka 001 0 eng
020 _a0333187032
_c(pbk.)
039 9 _a201810110903
_badibah
_c201209112051
_dzaina
_c200401021604
_dtrainer
_c200109192043
_drahimi
_y08-18-1999
_zload
040 _dUKM
090 _aTA418.7.B6
090 _aTA418.7
_b.B6
090 _aTA418.7
_b.B6 3
100 1 _aBowen, D. K.,
_q(David Keith)
245 1 0 _aMicroscopy of materials :
_bmodern imaging methods using electron, x-ray and ion beams /
_cD. K. Bowen and C. R. Hall.
260 _aLondon :
_bMacMillan,
_c1975.
300 _aix, 304 p. :
_bill. ;
_c23 cm.
504 _aIncludes bibliographies and indexes
650 0 _aMicroscope and microscopy
_xTechnique
650 0 _aMaterials
_xMicroscopy
700 1 _aHall, C. R.,
_q(Christopher Roxby)
907 _a.b11477222
_b2020-10-15
_c2019-11-12
942 _c01
_n0
_kTA418.7.B6
914 _avtls000153138
991 _aFakulti Kejuruteraan
991 _aFakulti Sains Hayat
998 _a(2)l
_at
_b1999-05-08
_cm
_da
_feng
_gxxk
_y0
_z.b11477222
999 _c149392
_d149392