| 000 | 01032nam a2200277 a 4500 | ||
|---|---|---|---|
| 005 | 20250913134731.0 | ||
| 007 | he am baa | ||
| 008 | 981208s1978 xxu bm 00 eng | ||
| 039 | 9 |
_a201405211157 _brosli _c200708161738 _drashid _y08-18-1999 _zload |
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| 040 | _dUKM | ||
| 090 | _amikrofis tesis QC611.8.S5S26 1978 | ||
| 090 |
_amikrofis tesis QC611.8.S5 _cS26 1978. |
||
| 100 | 1 |
_aSandow, Peter Micheal, _d1947- |
|
| 245 | 1 | 3 |
_aAn investigation of deep levels in silicon _h[microform] / _cby Peter Micheal Sandow. |
| 260 |
_aAnn Arbor, Mich. : _bUniversity Microfilms International , _c1978. |
||
| 300 |
_a2 microfiches ; _c11 x 15 cm. |
||
| 502 | _aThesis (Ph.D.) - Pennsylvania State University, 1977. | ||
| 650 | 0 |
_aSemiconductors _xSilicon. |
|
| 907 |
_a.b11143447 _b2021-05-28 _c2019-11-12 |
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| 942 |
_c3 _n0 _kmikrofis tesis QC611.8.S5S26 1978 |
||
| 914 | _avtls000118836 | ||
| 990 | _ar | ||
| 991 | _aFakulti Sains Fizik dan Gunaan | ||
| 998 |
_at _b1999-05-08 _cm _da _feng _gxxu _y0 _z.b11143447 |
||
| 999 |
_c116124 _d116124 |
||