| 000 | 01020nam a2200289 a 4500 | ||
|---|---|---|---|
| 005 | 20250913104207.0 | ||
| 008 | 981208s1987 si 00 eng | ||
| 020 | _a9971505118 | ||
| 035 | _a600618 | ||
| 039 | 9 |
_a200504292104 _bdollah _y08-18-1999 _zload |
|
| 090 | _aQD130.A52 | ||
| 090 | _aQD130 | ||
| 245 | 0 | 0 |
_aAnalytical techniques for material characterization : _bproceedings of the International Workshop Baton Rouge, USA, 11-16 May 1987 / _ceditors W. E. Collins, B. V. R. Chowdari, S. Radhakrishna |
| 260 |
_aSingapore : _bWorld Scientific, _c1987 |
||
| 300 |
_axiii, 407 p. : _bill. ; _c22 cm. |
||
| 440 | _aWSPC-costed series engineering technology | ||
| 650 | 0 | _aAnalytical techniques | |
| 700 | 1 | _aCollins, W. E. | |
| 700 | 1 | _aChowdari, B.V.R. | |
| 907 |
_a.b10087448 _b2021-05-28 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kQD130.A52 |
||
| 914 | _avtls000009190 | ||
| 990 | _ano | ||
| 991 | _aFakulti Sains Fizik dan Gunaan | ||
| 998 |
_at _b1999-05-08 _cm _da _feng _gsi _y0 _z.b10087448 |
||
| 999 |
_c10776 _d10776 |
||