| 000 | 00776nam a2200253 a 4500 | ||
|---|---|---|---|
| 005 | 20250913133000.0 | ||
| 008 | 981208s1985 us 00 eng d | ||
| 010 | _a84-27128 | ||
| 039 | 9 |
_a201308120935 _bnorsiah _y08-18-1999 _zload |
|
| 090 | _aTK7868.P7B37 | ||
| 090 |
_aTK7868.P7 _bB37 |
||
| 100 | 1 | _aBateson, John | |
| 245 | 1 | 0 |
_aIn-circuit testing / _cby John Bateson |
| 260 |
_aNew York : _bVan Nostrand Reinhold, _c1985 |
||
| 300 |
_a243p. : _c26 cm. |
||
| 650 |
_aPrinted circuits _xTesting |
||
| 907 |
_a.b11038676 _b2021-05-28 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kTK7868.P7B37 |
||
| 914 | _avtls000107863 | ||
| 991 | _aFakulti Sains Fizik dan Gunaan | ||
| 991 | _aFakulti Kejuruteraan | ||
| 998 |
_al _b1999-05-08 _cm _da _feng _g _y0 _z.b11038676 |
||
| 999 |
_c105684 _d105684 |
||