000 01241nam a2200313 a 4500
005 20250930095746.0
008 981208s1981 nyua 001 0 eng
010 _a81-82105
039 9 _a201301140936
_bzabidah
_y08-18-1999
_zload
043 _an-us---
090 _aTK7878.I33 3[00006004738]
090 _aTK7878
_b.I33
245 0 0 _aIEEE standard ATLAS test language /
_csponsor, IEEE ATLAS Committee of the IEEE Standards Board.
260 _aNew York, N.Y. :
_bInstitute of Electrical and Electronics Engineers,
_c1981.
300 _a1 v. (various pagings) :
_bill. ;
_c27 cm.
500 _a'IEEE Std 416-1981 (Revision of IEEE Std 416-1978)'
500 _aIncludes index.
650 0 _aATLAS (Computer program language)
650 0 _aElectronic apparatus and appliances
_xTesting
_xData processing.
650 _aElectric engineering
_vStandards
_zUnited States.
710 2 _aIEEE ATLAS Committee.
710 2 _aInstitute of Electrical and Electronics Engineers.
_938219
907 _a.b11014064
_b2021-05-28
_c2019-11-12
942 _c01
_n0
_kTK7878.I33 3[00006004738]
914 _avtls000105334
991 _aFakulti Sains Fizik dan Gunaan
998 _al
_b1999-05-08
_cm
_da
_feng
_gnyu
_y0
_z.b11014064
999 _c103230
_d103230