000 00872nam a2200265 a 4500
005 20250913132755.0
008 981208s1995 xxu 000 0 eng d
020 _a0890067260
_cRM209.04
039 9 _a201212310854
_bzaleha
_c200103130940
_dasiah
_y08-18-1999
_zload
040 _aUKM
090 _aTK7871.99.M44R35
090 _aTK7871.99.M44
_bR35
100 1 _aRajsuman, Rochit.
245 1 0 _aIddq testing for CMOS VLSI /
_cRochit Rajsuman.
260 _aBoston :
_bArtech House,
_c1995.
300 _a193 p. :
_bill. ;
_c24 cm.
650 0 _aIddq testing.
650 0 _aIntegrated circuits
_xVery large scale integration
_xTesting.
907 _a.b11010861
_b2021-05-28
_c2019-11-12
942 _c01
_n0
_kTK7871.99.M44R35
914 _avtls000105007
991 _aFakulti Kejuruteraan
998 _al
_b1999-05-08
_cm
_da
_feng
_gxxu
_y0
_z.b11010861
999 _c102910
_d102910