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	1.	No cover image available An approach to current sensor and test processor design for simultaneous logic and IDDQ testing of CMOS integrated circuits / Md. Altaf-ul-Amin by Altaf-ul-Amin, Md Publication details: Bangi : Fakulti Kejuruteraan, Universiti Kebangsaan Malaysia, 1999 Dissertation note: Thesis (M.Sc.) - Universiti Kebangsaan Malaysia, 1999 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7874.75.A47 1999 3tesis. Place hold
	2.	No cover image available An approach to current sensor and test processor design for simultaneous logic and IDDQ testing of CMOS integrated circuits [microform] / Md. Altaf-ul-Amin by Altaf-ul-Amin, Md Publication details: Bangi : Perpustakaan Tun Seri Lanang, 1999 Dissertation note: Thesis (M.Sc.) - Universiti Kebangsaan Malaysia, 1999 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: mikrofilem tesis TK7874.75.A47 1999. Place hold

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