Results of search for 'ccl=su:"Semiconductors"'

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	101.	Data Mining and Diagnosing IC Fails [electronic resource] / by Leendert M. Huisman. by Huisman, Leendert M SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 31 Publication details: Boston, MA : Springer Science+Business Media, Inc., 2005 In: Springer e-books Online resources: Click here to access online Availability: No items available.
	102.	Deep impurities in semiconductors / A. G. Milnes by Milnes, A. G. (Arthur George), 1922- Publication details: New York : John Wiley & Sons, 1973 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (4)Call number: QC611.M644, ... Place hold
	103.	No cover image available Deep level transient spectroscopy characterization of semiconductors ( microform) by Wei-I Lee by Wei-I, Lee Publication details: Ann Arbor, Mich. University Microfilms International 1989 Dissertation note: Thesis (Ph.D.) - Rensselaer Polytechnic Institute, 1988 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: TK7871.85.W44 1989 4mikrofis. Place hold
	104.	No cover image available Deep-level transient spectroscopy studies of galium-arsenide - aluminium-galium - arsenide heterostructures and superlattices [microform] / by Paul Alan Martin by Martin, Paul Alan Publication details: Ann Arbor, Mich. : University Microfilms International , 1986 Dissertation note: Thesis (Ph.D.) - University of Illinois, 1986 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: mikrofis tesis QC611.8.G3M27 1986. Place hold
	105.	Deep levels in semiconductors / M. Jaros by Jaros, M Publication details: Bristol : Hilger, 1982 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (2)Call number: QC611.8.D5J3[00008040819], ... Place hold
	106.	No cover image available Defect analysis in high-resistivity semiconductors by transient deep-level spectroscopy [microform] / by Paul Otto Braatz by Braatz, Paul Otto Publication details: Ann Arbor, Mich. : University Microfilms International , 1984 Dissertation note: Thesis (Ph.D.) - University of California, 1984 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: mikrofis tesis QC611.6.D4B72 1984. Place hold
	107.	No cover image available Defect characterization in semiconductors by deep level transient spectroscopy [microform] / by Lalgudi M. G. Sundaram by Sundaram, Lalgudi M. G Publication details: Ann Arbor, Mich. : University Microfilms International , 1985 Dissertation note: Thesis (Ph.D.) - Rensselaer Polytechnic Institute, 1984 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: mikrofis tesis QC611.6.D4S96 1985. Place hold
	108.	No cover image available Defect control in semiconductors : proceedings of the international conference on the science and technology of defect control in semiconductors, the Yokohama 21st century forum, Yokohama, Japan September 17-22, 1989 / edited by K. Sumino by International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan) Sumino, K 1931- Publication details: Amsterdam : North-Holland, 1990 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (2)Call number: QC611.6.D4I583 1989[00008027923], ... Place hold
	109.	Defect processes induced by electronic excitation in insulators / edited by Noriaki Itoh by Itoh, Noriaki Series: Directions in condensed matter physics ; v. 5 Publication details: Singapore : World Scientific, 1989 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QC611.6.D4D42[00008040808]. Place hold
	110.	Defect recognition and image processing in semiconductors and devices : proceedings of the Fifth International Conference, 6-10 September 1993 / edited by J. Jimenez by Jimenez, J International Symposium on Defect Recognition and Image Processing in III-V Compounds (5th : 1993 : Santander, Spain) Series: Institute of Physics conference series ; 135 Publication details: Bristol : Institute of Physics, 1994 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7871.85.D454. Place hold
	111.	Defects and radiation effects in semiconductors, 1980 / edited by R.R. Hasiguti by International Conference on Defects and Radiation Effects in Semiconductors ( 1980 : Oiso) Hasiguti, R. R Series: Conference series Institute of Physics 0305-2346 ; no.59 Publication details: Bristol : Institute of Physics, 1981 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (3)Call number: QC611.6.D4I5 1980, ... Place hold
	112.	Defects in High-k Gate Dielectric Stacks [electronic resource] : Nano-Electronic Semiconductor Devices / edited by Evgeni Gusev. by NATO Advanced Research Workshop on Defects in High-K Dielectric Nano-electronic Semiconductor Devices (2005 : Saint Petersburg, Russia) Gusev, Evgeni SpringerLink (Online service) Series: NATO Science Series II: Mathematics, Physics and Chemistry ; 220 Publication details: Dordrecht : Springer, 2006 In: Springer e-books Online resources: Click here to access online Availability: No items available.
	113.	No cover image available Defects in semiconductors : proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A. / editors, J. Narayan and T.Y. Tan by Narayan, J. (Jaydish) Tan, T. Y Materials Research Society Series: Materials Research Society symposia proceedings ; v.2 Publication details: New York : Elsevier North-Holland, 1981 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (5)Call number: QC611.6.D4D43, ... Place hold
	114.	No cover image available Defects in semiconductors : proceedings of the Materials Research Society Annual Meeting, November 1980, Boston, Massachusets, U.S.A. / editors, J. Narayan and T.Y. Tan by Narayan, J. (Jaydish) Tan, T. Y Materials Research Society Series: Materials Research Society symposia proceedings ; v.14 Publication details: New York : North-Holland, 1981 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QC611.6.D4D44. Place hold
	115.	Design and Modeling of Millimeter-Wave CMOS Circuits for Wireless Transceivers [electronic resource] : Era of Sub-100nm Technology / by Ivan Chee-Hong Lai, Minoru Fujishima. by Lai, Ivan Chee-Hong Fujishima, Minoru SpringerLink (Online service) Publication details: Dordrecht : Springer Science+Business Media B.V., 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available.
	116.	No cover image available Design of a low power compact CMOS direct conversion receiver for 2.4 GHz RFID applications / Mohammad Arif Sobhan Bhuiyan. by Bhuiyan, Mohammad Arif Sobhan [author.] Producer: 2016 Dissertation note: Thesis (Ph.D) - Universiti Kebangsaan Malaysia, 2016. Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7871.99.M44B498 2016 3 tesis. Place hold
	117.	Design of analog fuzzy logic controllers in CMOS technologies : implementation, test, and application / by Carlos Dualibe, Michel Verleysen, Paul G.A. Jespers by Dualibe, Carlos Verleysen, Michel Jespers, Paul G Publication details: Boston : Kluwer Academic Publishers, 2003 Online resources: Table of contents Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QA76.9.S63D824 3. Place hold
	118.	Design of CMOS operational amplifiers / Rasoul Dehghani. by Dehghani, Rasoul Series: Artech House microwave library Publication details: Boston, Mass. : Artech House, 2013 Other title: Design of complementary metal oxide semiconductor operational amplifiers. Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7871.99.M44D45 3. Place hold
	119.	Design of CMOS RF integrated circuits and systems / Kiat Seng Yeo, Manh Anh Do, Chirn Chye Boon. by Yeo, Kiat Seng Do, Manh Anh Boon, Chirn Chye Publication details: Singapore : World Scientific, 2010 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7874.78.Y468 3. Place hold
	120.	Design of High Voltage xDSL Line Drivers in Standard CMOS [electronic resource] / by Bert Serneels, Michiel Steyaert. by Serneels, Bert Steyaert, Michiel SpringerLink (Online service) Series: Analog Circuits and Signal Processing Series Publication details: Dordrecht : Springer Science + Business Media B.V, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available.

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