TY  - BOOK
AU  - Leblebici,Yusuf
AU  - Kang,Sung-Mo
TI  - Hot-carrier reliability of MOS VLSI circuits
SN  - 079239352X
PY  - 1993///
CY  - Boston, Mass.
PB  - Kluwer Academic Publishers
KW  - Integrated circuits
KW  - Very large scale integrated
KW  - Defects
KW  - Mathematical models
KW  - Metal oxide semiconductors
KW  - Reliability
KW  - Hot
KW  - carriers
N1  - Includes index
ER  -