Leblebici, Yusuf. <br/><br/>
Hot-carrier reliability of MOS VLSI circuits / 
by Yusuf Leblebici, Sung-Mo (Steve) Kang. 
 - Boston, Mass. :  Kluwer Academic Publishers,  1993. 
 - 212 p. :  ill. ;  24 cm. 
<br/><br/> Includes index. 
<br/><br/><label>ISBN: </label>079239352X  RM325.95 
<br/><br/><label>LCCN: </label>93-15447 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Very large scale integrated--Defects--Mathematical models.<br/>Metal oxide semiconductors--Reliability--Mathematical models.<br/>Hot--carriers--Reliability--Mathematical models.