TY  - BOOK
AU  - Lee,Jack Chung-Yeung
TI  - High-field reliability of MOS devices
PY  - 1989///
CY  - Ann Arbor, Mich.
PB  - University Microfilms International
KW  - Metal oxide semiconductors
KW  - Metal oxide semidonductors
KW  - Field
KW  - effect transistor
N1  - Thesis (Ph.D.) - University of California, 1988
ER  -