TY  - BOOK
AU  - Lanza,Mario
TI  - Conductive atomic force microscopy: applications in nanomaterials 
SN  - 9783527340910
PY  - 2017///
CY  - Weinheim, Germany
PB  - Wiley-VCH
KW  - Microscopy, Atomic Force
N1  - Includes bibliographical references and index
ER  -