Metrology and standardization of nanotechnology : protocols and industrial innovations - Mansfield, Elisabeth; Kaiser, Debra L.; Fujita, Daisuke; Voorde, M. H. van de (Marcel H.) (Weinheim, Germany : Wiley-VCH, 2017)
Includes bibliographical references and index.
Online resource; title from PDF title page (John Wiley, viewed January 31, 2017).
Keywords: Nanotechnology; Metrology; Electronic books