Dimensional stability of low expansivity materials (microform) : time dependent changes in optical contact interfaces and phase shifts on reflection from multilayer dielectrics - Berthold, John William, III, 1945- (Ann Arbor, Mich. : University Microfilms International, 1976)
Thesis (Ph.D.)-University of Arizona, 1976
Keywords: Steel -- Electrometallurgy; Steel -- Electric properties