Hnatek, Eugene R. <br/><br/>
Digital integrated circuit testing from a quality perspective / 
Eugene R. Hnatek 
 - New York :  Van Nostrand Reinhold,  1993 
 - 179 p. :  ill. ;  23 cm. 
<br/><br/><label>ISBN: </label>0442006438  RM171.03 
<br/><br/><label>LCCN: </label>93-13739 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Digital integrated circuits--Testing--Quality control