Hays, Ron D. <br/><br/>
Beyond internal consistency reliability :  rationale and user's guide for multitrait analysis program on the microcomputer / 
Ron D. Hays, Toshi Hayashi. 
 - California :  Rand Corporation,  1990. 
 - 9 p. ;  28 cm. 
 - A Rand note ;  N-3155-RC .
 - Rand note ;  N-3155-RC. .
<br/><br/>Includes bibliographical references (p.8-9) 
<br/><br/><label>ISBN: </label> Hadiah 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scale analysis (Psychology)--Computer programs<br/>Psychometrics