TY  - BOOK
AU  - Oklobdzija,Vojin G.
TI  - Design for testability of VLSI structures through the use of circuit techniques (microform)
PY  - 1982///
CY  - Ann Arbor, Mich.
PB  - University Microfilms International
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Testing
N1  - Thesis (Ph.D.)-University of California, 1982
ER  -