Oklobdzija, Vojin G. <br/><br/>
Design for testability of VLSI structures through the use of circuit techniques (microform) / 
Vojin G. Oklobdzija 
 - Ann Arbor, Mich. :  University Microfilms International ,  1982 
 - 2 microfiches ; 11 x 15 cm. 
<br/><br/>Thesis (Ph.D.)-University of California, 1982 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Very large scale integration--Testing