TY  - BOOK
AU  - Jimenez,J.
ED  - International Symposium on Defect Recognition and Image Processing in III-V Compounds
TI  - Defect recognition and image processing in semiconductors and devices: proceedings of the Fifth International Conference, 6-10 September 1993 
SN  - 0750302941
PY  - 1994///
CY  - Bristol
PB  - Institute of Physics
KW  - Semiconductors
KW  - Defects
KW  - Congresses
KW  - Image processing
ER  -