TY  - BOOK
AU  - Loretto,M.H
AU  - Smallman,R.E
TI  - Defect analysis in electron microscopy
SN  - 0412137607
PY  - 1975///
CY  - London
PB  - Chapman & Hall
KW  - Crystals
KW  - Defects
KW  - Electron microscopy
N1  - Includes index; Bibliography: p. 131
ER  -