Loretto, M. H <br/><br/>
Defect analysis in electron microscopy / 
M. H. Loretto and R. E. Smallman 
 - London :  Chapman & Hall,  1975 
 - ix, 134 p. :  ill. ;  24 cm. 
<br/><br/> Includes index 
<br/><br/>Bibliography: p. 131 
<br/><br/><label>ISBN: </label>0412137607 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Crystals--Defects<br/>Electron microscopy