He, Ming. <br/><br/>
Metal-dielectric interfaces in gigascale electronics :  thermal and electrical stability / 
Ming He, Toh-Ming Lu. 
 - New York :  Springer,  2012. 
 - xi, 149 p. :  ill. (some col.) ;  24 cm. 
 - Springer series in materials science ;  v. 157. .
 - Springer series in materials science ;  v. 157. .
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9781461418115 (hbk.)  RM372.41 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microelectronics--Materials<br/>Interfaces (Physical sciences)