TY  - BOOK
AU  - Wei-I,Lee
TI  - Deep level transient spectroscopy characterization of semiconductors ( microform)
PY  - 1989///
CY  - Ann Arbor, Mich.
PB  - University Microfilms International
KW  - Semiconductors
KW  - Defects
N1  - Thesis (Ph.D.) - Rensselaer Polytechnic Institute, 1988
ER  -