Wei-I, Lee <br/><br/>
Deep level transient spectroscopy characterization of semiconductors ( microform) 
by Wei-I Lee 
 - Ann Arbor, Mich.  University Microfilms International  1989 
 - 3 microfiches ; 11 x 15 cm. 
<br/><br/>Thesis (Ph.D.) - Rensselaer Polytechnic Institute, 1988 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Defects