Micro- and nanoscale phenomena in tribology / 
edited by Yip-Wah Chung. 
 - Boca Raton, FL. :  CRC Press,  2012. 
 - ix, 210 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9781439839225 (hbk.)  RM445.28 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Tribology.<br/>Nanotechnology.