Power-aware testing and test strategies for low power devices  [electronic resource] / 
edited by Patrick Girard, Nicola Nicolici, Xiaoqing Wen. 
 - Boston, MA :  Springer Science+Business Media, LLC,  2010. 
 - 1online resource (382 pages) :  illustrations, digital. 
<br/><br/><label>ISBN: </label>9781441909282  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Low voltage integrated circuits--Power supply.<br/>Low voltage integrated circuits--Testing.<br/>Circuits and Systems.<br/>Computer-Aided Engineering (CAD, CAE) and Design.