TY  - BOOK
AU  - Garg,Rajesh
AU  - Khatri,Sunil P.
ED  - SpringerLink (Online service)
TI  - Analysis and design of resilient VLSI circuits: mitigating soft errors and process variations 
SN  - 9781441909312 (electronic bk.)
AV  - TK7874.75 .G37 2010
U1  - 621.395 22
PY  - 2010///
CY  - Boston, MA
PB  - Springer-Verlag US
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Engineering
KW  - Circuits and Systems
KW  - Computer-Aided Engineering (CAD, CAE) and Design
UR  - https://eresourcesptsl.ukm.remotexs.co/user/login?url=
ER  -