Garg, Rajesh. <br/><br/>
Analysis and design of resilient VLSI circuits  mitigating soft errors and process variations /  [electronic resource] : 
by Rajesh Garg, Sunil P. Khatri. 
 - Boston, MA :  Springer-Verlag US,  2010. 
 - xxiii, 212 p. :  ill., digital ;  25 cm. 
<br/><br/><label>ISBN: </label>9781441909312 (electronic bk.) 9781441909305 (paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Very large scale integration.<br/>Engineering.<br/>Circuits and Systems.<br/>Computer-Aided Engineering (CAD, CAE) and Design.
<br/><br/><label>LC Class. No.: </label>TK7874.75  / .G37 2010 
<br/><br/><label>Dewey Class. No.: </label>621.395