New horizons of applied scanning electron microscopy - Shimizu, Kenichi; Mitani, Tomoaki; SpringerLink (Online service) (Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2010)
Keywords: Scanning electron microscopy; Spectroscopy and Microscopy; Solid State Physics; Nanotechnology and Microengineering; Surfaces and Interfaces, Thin Films; Measurement Science and Instrumentation